Representing manufacturing services for California customers since 1992.
"I had the pleasure of working with Datanet for nearly four years. During that time, they taught me the meaning of value. While COGS are important and easily measured, value is not. Too often, intangibles such as service are overlooked. I would welcome the opportunity to trust them with my supply base over and over."
 
Through our partners, Datanet Sales provides a state-of-the-art analytical laboratory for materials, qualification and failure analysis on bare PCBs, PC assemblies, electronic components, and raw materials. The analytical techniques include non-destructive uniquely modified LV SEM-EXDS (Low Vacuum SEM-EDXS), custom design and custom built Real-Time Micro-Focus Transmission X-ray, Optically collimated Micro-Spot X-Ray Fluorescence (XRF) Thickness and Composition Measurement System and a wide range of optical microscopy techniques.  This caliber of analytical support is critical to the development of effective advanced manufacturing processes, and to maintaining high yield and quality through ongoing process control.

Mechanical Testing

Shear Force Test

Pull Force Test

Compression / Tension Strength Test

Micro Hardness Test

Contact Angle Cleanliness Testing

Viscosity Measurement

Wetting Balance Testing

Precision Coordinate Measurement

 

Reliability / Stress Testing

Temperature Cycling / Shock

Vibration / Mechanical Shock

Humidity

Other (pressure, UV, vacuum, corrosion, ESD, etc.)

 

Consulting Services

Assembly Process Evaluation

Supplier Quality Evaluation

Material Evaluation and Qualification

 
 

 

 

 

 

 

 

 

 

 

 

 

Optical Imaging

Stereo Zoom Microscopy

Metallurgical Microscopy

Rotational Microscopy

Inverted Microscopy

 

Non - Optical Imaging

Scanning Acoustical Microscopy (CSAM)

Scanning Electron Microscopy (SEM)

Transmission Z-Raly Imaging

Laser Profiling

 

Elemental Analysis

Energy Dispersive Spectroscopy (EDS)

Ionic Contamination Testing

X-Ray Fluorescence Analysis (XRF)

Fourier Transform Infrared (FTIR) Spectroscopy

Scanning Auger Microscopy

X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis (XPS?ESCA)

Atomic Absorption (AA)

Liquid/Gaseous Chromatography (LC/GC)

Sequential Electrochemical Reduction Analysis (SERA)

 

Sample Preparation

Cross Sectioning

Decapsulation

Micro Etching

Die Penetration

 

Thermal Testing

Thermogravimetric Analysis (TGA)

Thermomechanical Analysis (TMA)

Differential Scanning Calorimetery (DSC)

Infrared Imaging